LTX-Credence Corporation, a Milpitas, Calif.-based provider of semiconductor ATE solutions, has reportedly launched a new system architecture, the Integrated Multi-system Architecture that improves floor efficiency. The IMA leverages compact, low cost test systems as fundamental building blocks to support the assembly of optimized test system arrays.

 

Extremely flexible, IMA tester arrays do away with the requirement of expensive, physically large, high pin count systems. Customers can use the IMA controllers to bundle up multiple low cost systems into a tester array that enable massive multi-site testing.

 

What’s more, IMA tester arrays can be quickly reconfigured into individual testers to cater to the volatile dynamics of semiconductor production. Semiconductor manufacturers can use the IMA tester arrays to adopt the most cost effective manufacturing test strategies for the complete range of SoC and SiP applications.

 

"The IMA concept sets new benchmarks in production flexibility and efficiency vital to cost down demands of the semiconductor industry,” said Bruce MacDonald, vice president of marketing at LTX-Credence, in a statement. “Today, manufacturers purchase larger, expensive systems to address devices requiring a high number of tester resources, but often use them for much less demanding applications. IMA changes the paradigm to compact, lower cost platforms optimizing resource deployment without sacrificing high end needs. LTX-Credence pioneered the concept of a single, scalable test platform, and now the future of our industry is in IMA compliant tester arrays."

 

For the past several years, LTX-Credence has been fulfilling the varied test requirements of the wireless, computing, automotive and entertainment industries through its vast portfolio of technologies, the largest installed base in the Asia-Pacific region, and a global network of strategically deployed applications and support resources.

 

 Earlier this year, TMCnet reported that Ralink (News - Alert) Technology Corporation selected the X-Series from LTX-Credence as its next-generation wireless test platform.